Photoconductive Atomic Force Microscopy and Investigation of Electrical Properties and Morphology of Surface

Photoconductive AFM has been well-known as a effective and applicable method to investigate morphology in nanoscale and surface properties simultaneously. It, also, images the relationship between function-properties and structure in nanoscale materials. Similar to other methods of AFM, this technic possess specific machinery including a reversed microscope and a light source. In this regards, PC-AFM can be used to characterization of hole-electron transfer in photoconductive cells and organic solar cells. In fact, PC-AFM is still novel and requires to be investigated and developed.