Fe/Al/Fe tritilayers; Thin film; High Temperature in X-Ray Diffraction (HT-XRD)

IIn this paper, the results of the structure and magnetic properties of Fe/Al/Fe multilayers were prepared on monocrystalline Si were investigated. Thin films were obtained by RF Magnetron Sputtering Method (RF-MSM). The results of XRD analysis show that the preferred direction of Fe/Al/Fe multilayers is oriented (200). Then, the thermal behavior of samples in high temperatures in vacuum was studied using HT – XRD analysis between 26°C-800°C at 180min. Finally, the morphology of surface, gin sized and magnetic properties were studied using AFM, MFM, and AGFM analysis, respectively.