Using RAPD molecular markers to differentiate resistant and susceptible cultivars to Mycosphaerella graminicola

Septoria leaf blotch caused by Mycosphaerella graminicola is one of the most important diseases of wheat that can become epidemic and cause severe yield loss in favorable conditions. There are different methods to control this disease but using resistant cultivars is a safe and suitable way for its control. Traditional evaluation of disease resistance is very time consuming. In recent years، molecular markers such as RAPD have been developed for quick evaluation of resistant cultivars. In this study seven RAPD molecular markers were separately assayed for ability to differentiate three resistant and three sensitive cultivars to Septoria leaf blotch. The results showed that only OPH20 marker created one sharp polymorphic band in 1200bp region in the resistant cultivars while this band was not observed in the sensitive cultivars. So considering the abundance of cultivars، this molecular marker may be suggested for use to differentiate cultivars against Mycosphaerella graminicola in future research projects.