Design and Fabrication of Dielectric Constant Measurement Setup without Sample Holder in C band Motor

Characterization of dielectric materials by using rectangular waveguide method usually requires a sample holder frame and a complex procedure of preparing and fixing the sample. In this paper, by removing the sample holder, the conventional waveguide method is made faster and simpler. It is shown that the conventional TRL calibration method together with NRW algorithm is able to obtain dielectric constant and loss tangent. The method is fully studied for different materials in a C band measurement setup. It is shown that for materials with lower thickness, the precision of the method up to a thickness of 0.35 λ_g (wavelength of matter under test) is acceptable. The simulation and the measurement error of a 1.5mm substrate with a dielectric constant of 3 are less than 8% and 15% respectively.