The Investigation of the Destructive Effects of Hydrogen and Argon Ions produced in The Plasma Focus Device on Graphite

The destructive effects of high-energy hydrogen and argon ions irradiated in the MTPF-2 Mather type plasma focus device on the surface and structural properties of graphite were investigated. Raw and irradiated samples were analyzed using a Scanning Electron Microscope. While microscopic images of samples irradiated with hydrogen ions point sputtering, pores are seen on the samples' surface along with spot melts, the predominant phenomenon on the surface of samples irradiated with argon ions is sputtering of particles from the graphite surface. X-ray diffraction analysis was used to investigate the changes caused by the irradiation of high-energy protons and argon ions on the graphite structure. In the X-ray diffraction spectrum of the irradiated samples, the peaks' displacement, and the change in the peaks' intensity compared to the X-ray diffraction spectrum of the reference sample were observed. The peak of the graphite sample's locations irradiated with hydrogen and the sample irradiated with argon have been shifted to smaller angles. The displacement of the peaks in the proton-irradiated sample is higher than that of the argon ions. The argon ion and hydrogen ion beam specifications were calculated using the Lee code.