Structural charactrisation of CdS thin film's grown on substrates under different conditions

Cadmium sulfide thin films were fabricated in a vacuum (5 10-6torr) with 2. 5 nm/s coating rate and the approximate thickness of 800nm. In order to study the effects of the substrate on the structural properties of samples، two types of substrates (glass and ITO) were used. Structural properties of the samples were studied by X-ray diffraction. Calculated structural parameters revealed that the samples built on ITO substrate had a better crystal structure compared to those made on glass substrate. Moreover، the calculation of stress and crystalline defects in the samples showed that the samples with ITO as substrate had better crystal quality. The CdS layers made on glass substrate were annealed at 200°C and 300°C for one hour in vacuum in order to study the effects of heat treatment on their structural properties. X-ray diffraction spectrum of samples prepared on glass substrate showed improvement of crystalline quality upon annealing.