Study on the structural, optical and electrical properties of ZnO:N thin films grown on glass and ZnO buffer layer by spray pyrolysis method

Nitrogen doped zinc oxide (ZnO:N) thin films are synthesized on glass and pure ZnO buffer layer at 450 °C by spray pyrolysis method. The XRD spectra show the grown samples have polycrystalline nature in hexagonal phase while their preferred growth direction are changed. This affectness is clear in such a way that the transmittances of the layers are decreased and their absorbances are increased. These variations are well compatible with the variations in the crystallite size and also crystalline defect density in these materials. Electrical properties of the layers show a higher electrical conductivity in sample grown on ZnO buffer layer compared with other one which is grown on glass substrate.