Genetic Analysis of Yield and Yield Related Traits in Bread Wheat (Triticum aestivum L.) under Drought Stress Condition

A generation mean analysis was conducted to study genetic of yield and yield related traits of bread wheat in drought stress condition. In this research F1, F2, BC1 and BC2 generations were developed created using Kavir and Roushan as parents. The generations and parents were evaluated in a randomized complete block design with three replications and the traits including yield, flag leaf area, 1000-grain weight, plant dry weight, grain number per spike, grain number per plant and pollen area were evaluated. Generation mean analysis was done by joint scaling test. Results showed that all gene effects including additive, dominance, additive × additive epistasis, additive × dominance epistasis and dominance × dominance epistasis were affected on these traits inheritance. The narrow sense heritability estimates were variable between 29%-to 66% for 1000-grain weight and grain number per plant, respectively. Grain number per plant, an important yield component, had the highest narrow sense heritability (66%) and response to selection (57%). Based on these results, this trait is recommended in wheat breeding programs in drought prone environment.