Introduction Electron Backscatter Diffraction in scanning electron microscope

The EBSD detector is one of the detectors that can be installed on the SEM or FESEM electron microscopes, so that in addition to having high-resolution images of surface morphology, this technique can provide quantitative and qualitative analysis of microstructures. With using this detector, we can find detailed information on microstructures of grain detection, grain boundary, angle, Crystallization rate and crystallinity orientation, crystalline defects, determination of cracks and corrosion boundaries, regional sample analysis. Using the above method, we can investigate a variety of metals, alloys, ceramics, minerals, powders, some polymers, etc. Therefore, it can be used as a very powerful tool in many sciences and industries such as solar technology, medical equipment, energy resources, materials science, geology, etc.