Scanning Impedance Microscopy in the Study of Nanostructures
Impedance Scanning Microscopy (SIM) is a combination of Scanning Probe Microscopy (SPM) with conductive probe and Impedance Spectroscopy. The SPM probes with nanometer size close to the surface and prepared three-dimensional topographic images with atomic resolution of sample surface. Typically in Scanning Probe Microscopy when require to create a potential difference between sample and probe, a direct current (dc) voltage is used directly to calculate the impedance of the alternating current (ac). Specifically, SIM is a method based on Scanning Probe Microscopy for preparing quantitive images from properties of alternating current.
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