Permutation Entropy as a Parameter of Characterizing the Surface of a Thin Film
Author(s):
Article Type:
Research/Original Article (دارای رتبه معتبر)
Abstract:
In this work, silver thin films were prepared using sputtering at different deposition times with the nanoscale thickness. To investigate their surface morphology, atomic force microscopy (AFM) and scanning electron microscopy (SEM) were employed. The surface topography of the samples studied using the AFM. The results revealed that, the roughness of the thin films enhanced by increasing the sputtering time. The permutation entropy (PE) was introduced as an interesting parameter to characterize the surface morphology. At the best of our knowledge, it is the first time one uses the PE for characterizing the thin films. Although the roughness might always enhance by increasing the film thickness, it was not the case for PE. The PE was found to be an independent parameter for characterizing the surface of thin film.
Keywords:
Language:
English
Published:
Chemical Methodologies, Volume:4 Issue: 2, May-Apr 2020
Pages:
152 to 160
magiran.com/p2091462
دانلود و مطالعه متن این مقاله با یکی از روشهای زیر امکان پذیر است:
اشتراک شخصی
با عضویت و پرداخت آنلاین حق اشتراک یکساله به مبلغ 990,000ريال میتوانید 70 عنوان مطلب دانلود کنید!
اشتراک سازمانی
به کتابخانه دانشگاه یا محل کار خود پیشنهاد کنید تا اشتراک سازمانی این پایگاه را برای دسترسی نامحدود همه کاربران به متن مطالب تهیه نمایند!
توجه!
- حق عضویت دریافتی صرف حمایت از نشریات عضو و نگهداری، تکمیل و توسعه مگیران میشود.
- پرداخت حق اشتراک و دانلود مقالات اجازه بازنشر آن در سایر رسانههای چاپی و دیجیتال را به کاربر نمیدهد.
In order to view content subscription is required
Personal subscription
Subscribe magiran.com for 50 € euros via PayPal and download 70 articles during a year.
Organization subscription
Please contact us to subscribe your university or library for unlimited access!