XRD studies of the lattice parameterschange, caused by the crystal defects.

Formation o f any kinll:-; ur crys ta l defects is followed hy creatIOn of mechanil.:ul s t resscs wi thim the t:ry:-;tal strut:tun.!. which in turn l.:chr('39')IUses l<.lllicc paramc ters to change. these changes resu lt a rclevant disp lacement of the X-ray dilfractogram pcaks. In this wo rk r e la tive tli :-;piaccmcllt ur it certa in peak ( III) of de fect ed and annealed :-;amp!c:.:s of AI and Cu [hive bCl:n studied u:-; ing an X-f<.ly diffrat:Lomctl:r, co ntro lled and assis ted by a high t:apahle computer progr<.lm. These fac ilit ies p rovide a high rc:-;olution for determinatio n o f peakchr('39')s positio n on the dirrral.:logram so that the relative displacement of a certain pcak, relevanlto the defected and an nealed samples was obtained with precision better than -{).Ol A. This study shows the reliability of our XRD high resol ution method for va ri o us <.I pp li Cl.ll io ns in the material resea rch fi e ld s. As an example of its appl it:at ions, using the resu lts o f t his wo rk, thl,; amount of residual stresses in these samples have been ue tcrmiocd.