Investigation of genetic diversity and selection of durum wheat pure lines with desirable agronomy traits using SIIG index

In order to study the genetic diversity and selection of superior durum wheat lines, 120 pure lines in Augmented non-repetition design, with two checks Shabrang and Hanna, in the farm of Darab Agricultural Research Station in the period of 2017-18, Were evaluated using SIIG method. SIIG was used to select the best lines in terms of morphological traits. The results of the correlation showed that grain yield (YLD) and thousand kernel weight (TKW) had the significant correlation with SIIG (0.850** and 0.626**), respectively. These findings showed that YLD and TKW have the most impact in the value of SIIG method, respectively. Therefore, selected genotypes with SIIG method will have high YLD and TKW. The studied lines were grouped into 7 categories based on this index. Lines of groups 1, 2 and 3 were the best lines with the SIIG highest value , respectively, and the possibility of obtaining top lines from this group is very high. The results of SIIG index showed that lines 137, 19, 20, 136 and 143 with SIIG values 0.819, 0.808, 0.796, 0.796 and 0.794, respectively were the best lines, but lines number 20 and 143 were recognized as the top lines due to its earlier. Genotypes of group 4 were the middle lines. Lines of groups 5, 6 and 7 with the lowest SIIG values were the weak lines. Finally, the results showed that SIIG method was able to group the studied lines simultaneously based on YLD, TKW and DHA and distinguish their distance.