Improvement in Electrical Characteristics of Silicon on Insulator Junctionless Field Effect Transistor (SOI-JLFET) Using the Auxiliary Gate

Silicon on insulator junctionless field effect transistor (SOI-JLFET) includes a single type doping at the same level in the source, channel, and drain regions. Therefore, its fabrication process is easier than inversion mode SOI-FET. However, SOI-JLFET suffers from high subthreshold slope (SS) as well as high leakage current. As a result, the SOI-JLFET device has limitation for high speed and low power applications. For the first time in this study, use of the auxiliary gate in the drain region of the SOI-JLFET has been proposed to improve the both SS and leakage current parameters. The proposed structure is called "SOI-JLFET Aug". The optimal selection for the auxiliary gate work function and its length, has improved the both SS and ION/IOFF ratio parameters, as compared to Regular SOI-JLFET. Simulation results show that, SOI-JLFET Aug with 20nm channel length exhibits the SS~71mV/dec and ION/IOFF~1013. SS and ON-state to OFF-state current (ION/IOFF) ratio of SOI-JLFET Aug are improved by 14% and three orders of magnitudes, respectively, as compared to the Regular SOI-JLFET. The SOI-JLEFT Aug could be good candidate for digital applications.