Study on correlation and path analysis for seed yield and its dependent traits in white bean genotypes (Phaseolus vulgaris L.)

In order to investigation the relations among the affective traits on white bean grain yield, a filed experiment was conducted with 46 promising lines of white bean and two improved check cultivars “Dehghan” and “Daneshkadeh” at the research field of Karaj, Seed and Plant Improvement Institute, Iran, in 2008 growing season. The experiment was performed as a randomized complete block design with three replications. The results of the traits’ correlation with the grain yield showed that all the characteristics under investigation have a positive and significant correlation with the grain yield. Among them a remarkable correlation was seen among the grain yield with the number of seeds per plant, the biological yield and the number of pod per plant. In the Regression Analysis, the first trait entering the model was” the number of seed per plant” which justified 73% of the yield alterations by its own. Then these characteristics entered the model respectively: 100 seeds weight, biological yield, pods weight, LAI (R8) and the pod Length and they justified 95% of yield alterations totally. To identify the direct and indirect effects of the traits on the grain yield, path analysis was performed; which showed that the traits of the number of seeds per plant, 100 seeds weight and the biological yield has the most positive and direct effect on the grain yield respectively.