Microleakage of class V cavities restored with nanofilled resin modified glass ionomer and conventional glass ionomer with self etch adhesive and self etch primer

Microleakage is a criterion proposed for assessing the success of any restorative material. Complete seal is difficult especially for dentin margins compared to enamel margins. The aim of this study was to assess the microleakage at the enamel and dentin margins of class V cavities restored by two GIs and two self-etch adhesive systems.
This study was done on forty third molars. Class V cavities (3×2×2mm) were prepared on the buccal and lingual surfaces of teeth using high speed handpiece with 0.8 mm diamond fissure burr. The occlusal margins of the cavities in the enamel and gingival marginswere placed 1 mm below the CEJ. The teeth were divided into 4 groups and the bondings were cured for 20 sec and the teeth were restored. The specimens were kept in distilled water at the temperature of 37°C for 24 hrs. The teeth were thermo cycled and cut in buccolingual direction using diamond disc under water. The dye penetration was evaluated using a stereomicroscope and the leakage was scored. The scores were compared using Kruskal-Wallis test while the paired comparisons were done using Bonferroni correction. P≤0.05 was regarded as significant results.
Microleakage scores were similar at the occlusal and gingival walls of all test groups. At the gingival walls, the least microleakage scores were observed. “Fuji IX SE bond” group showed significant differences with the “Fuji IX G bond” and “Nanoglass G bond” groups (P≤0.05). At the occlusal walls, the least scores were observed in the “Fuji IX bond” specimens which were significantly different from the other groups (P≤0.05).
Self-Cure glass ionomers yielded less microleakage scores compared to the different types of light-cures due to the less polymerization shrinkage.